| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5364917 | Applied Surface Science | 2012 | 5 Pages |
Abstract
⺠XPS core level studies allowed us to determine the variation of interface Fermi level position for L-CVD SnO2 ultrathin films after the various technological treatments. ⺠Valence band XPS studies showed the existence of two different bands of filled electronic states localized about 6.0 eV and 3.0 eV below the Fermi level, respectively. ⺠The variation of surface electronic properties of L-CVD SnO2 ultrathin films was assigned to the variation of their surface chemistry, including carbon contamination.
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Authors
M. Kwoka, L. Ottaviano, J. Szuber,