| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5365161 | Applied Surface Science | 2010 | 8 Pages |
Abstract
Adhesion measurements were performed by AFM (Atomic Force Microscopy). It was shown that many parameters need to be controlled in order to provide reproducible and quantitative results. Adhesion forces were shown to depend on combination of materials characteristics and testing geometry as well as experimental protocol (contact time, contact force and contact area). This contact area was modified by means of FIB (Focused Ion Beam) milling and deliberate abrasion. As a result, a drastic change in adhesion could be observed. Still, those are problems connected to adjustment of interacting surfaces.
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Authors
Olavio Dos Santos Ferreira, Edwin Gelinck, Dennis de Graaf, Hartmut Fischer,