| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5365265 | Applied Surface Science | 2007 | 14 Pages |
Abstract
Depth profile analysis (argon ion etching/X-ray photoelectron spectroscopy) was conducted on a series of Fe-16Cr-16Ni-2Mn-1Mo-2Si austenitic stainless steel samples oxidized at 973 and 1073Â K with exposure times of 25, 100, 193, 436 and 700Â h. Surface and near surface rearrangement following oxidation resulted in a region of high Cr concentration on all oxidized samples. Temperature and time dependence to O2 penetration depth was observed. In general, O2 penetration depth was found to increase with increasing exposure up to 436Â h. No increase in depth was observed between 436 and 700Â h exposure time.
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Authors
James A. Jr., Ranjani V. Siriwardane, J.S. Dunning, D.E. Alman, J.C. Rawers,