Article ID Journal Published Year Pages File Type
5365393 Applied Surface Science 2008 5 Pages PDF
Abstract
When analyzing spectra from metals and semiconductors according to the described background subtraction, the same information contained in the momentum range up to 35 × 10−3m0c or beyond can be extracted, as if the spectra were measured employing a coincidence setup with two Ge-detectors.
Keywords
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Preview
High-momentum analysis in Doppler spectroscopy
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