Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5365726 | Applied Surface Science | 2010 | 5 Pages |
Abstract
An atomic force microscope is used to study the effect of humidity on the interaction between carbon nanotubes anchored to atomic force microscopy tips and various samples. Commercial silicon tips were also used for comparison. Adhesion force and dissipative energy were measured between these tips and highly oriented pyrolytic graphite (HOPG) and PMMA in contact mode. The data provides a detailed understanding of carbon nanotube interactions as a function of humidity.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
David Chabrier, Bharat Bhushan, Sophie Marsaudon,