| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5365757 | Applied Surface Science | 2006 | 6 Pages |
Abstract
The lattice defects in polydiacetylene (PDA) single crystals prepared using physical vapor growth were investigated by white beam X-ray topography. Line patterns along the [0Â 0Â 1] and [1Â 0Â 2] directions were clearly observed. Appearance of the line patterns along the [0Â 0Â 1] direction proves the polymerization direction predicted by Hädicke et al. The topographic results are in good agreement with the surface morphologies investigated by atomic force microscopy (AFM).
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Authors
Sadaharu Jo, Hitoshi Yoshikawa, Akane Fujii, Mitsuru Takenaga,