Article ID Journal Published Year Pages File Type
5365796 Applied Surface Science 2007 4 Pages PDF
Abstract

We report the growth of cubic MgxZn1−xO alloy thin films on quartz by electron beam evaporation. It can be found that all the samples have sharp absorption edges by the absorption measurements. X-ray diffraction measurements indicate the MgxZn1−xO films are cubic phase with preferred orientation along the (1 1 1) direction. Energy dispersive spectrometry (EDS) demonstrates that the Mg concentration in MgxZn1−xO films is much higher than the ceramic target used, and the composition can be tuned in a small scope by varying the substrate temperature and the beam electric current. The reasons of this phenomenon are also discussed.

Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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