Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5365946 | Applied Surface Science | 2010 | 5 Pages |
Abstract
Amorphous silicon carbide (SiC) thin films were deposited on silicon substrates by pulsed laser ablation at room temperature. Thicknesses and surface morphology of the thin films were characterized using optical profilers, atomic force and field emission scanning electron microscopy. Nanohardnes, modulus and scratch resistance properties were determined using XP nanoindenter. The results show that crack free, smooth and nanostructured thin films can be deposited using low laser energy densities.
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Authors
H. ElGazzar, E. Abdel-Rahman, H.G. Salem, F. Nassar,