| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5366190 | Applied Surface Science | 2006 | 4 Pages |
Abstract
The antireflection Germanium carbide (Ge1-xCx) coating, deposited using RF reactive sputtering, on both sides of ZnS substrate wafer has been developed. The infrared (IR) transmittance spectra show that the IR transmittance in the wavelength region between 8 and 12 μm for the designed system Ge1-xCx/ZnS/Ge1-xCx is greatly enhanced compared to that for ZnS substrate. In addition, the double-layer coated ZnS substrate is approximately four times as hard as uncoated ZnS substrate. This investigation indicates that a double-layer Ge1-xCx coating can be used as an effective antireflection and protection coating on ZnS infrared window.
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Authors
C.Q. Hu, W.T. Zheng, J.J. Li, Q. Jiang, H.W. Tian, X.Y. Lu, J.W. Liu, L. Xu, J.B. Wang,