| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5366504 | Applied Surface Science | 2012 | 7 Pages |
Abstract
⺠We characterized various defects observed in a-plane GaN epilayers using TEM. ⺠We presented comparative discrimination methods to identify various line and planar defects observed in a-GaN. ⺠Investigations of the types of defects observed under different two-beam conditions of the various zone axes were performed in detail.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Bo Hyun Kong, Qian Sun, Jung Han, In-Hwan Lee, Hyung Koun Cho,