| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5366827 | Applied Surface Science | 2009 | 7 Pages |
Abstract
ZnTe and ZnTe:Cr films were prepared on glass substrate by using thermal evaporation method. X-ray diffraction analysis revealed the presence of ZnCrTe phase. X-ray photoelectron spectroscopy was used to estimate the composition of as-prepared films. The valence state of Cr in ZnTe:Cr film is determined to be +2 by using electron spin resonance spectroscopy. Magnetic moment data as a function of magnetic field was recorded by using superconducting quantum interference device magnetometry at 300Â K. The result showed a clear hysteresis loop with coercive field of 48Â Oe. Magnetic domains were observed by using magnetic force microscopy and the average value of domain size was 3.7Â nm.
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Authors
D. Soundararajan, D. Mangalaraj, D. Nataraj, L. Dorosinskii, J. Santoyo-Salazar, H.C. Jeon, T.W. Kang,