Article ID Journal Published Year Pages File Type
5366965 Applied Surface Science 2006 4 Pages PDF
Abstract
Results from coincidence Doppler broadening (CDB) measurements on various Si samples and Brazilian quartz having low quartz structure are presented with the aim to give further strong indication of the existence of a low quartz structure, but not of Si divacancies as frequently considered, at the SiO2/Si interface.
Keywords
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Preview
Further indication of a low quartz structure at the SiO2/Si interface from coincidence Doppler broadening spectroscopy
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