| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5367436 | Applied Surface Science | 2007 | 5 Pages |
Abstract
In/Pd and Pd/In/Pd thin films were prepared by thermal evaporation on the SiO2 substrate in a vacuum. The structural and optical properties of the films were investigated by means of X-ray diffractometry (XRD), Auger electron spectroscopy (AES) and spectroscopic ellipsometry (SE). Auger depth profile studies were performed in order to determine the composition of elements in the Pd-In systems. Interdiffusion of metals was detected at room temperature. Optical properties of Pd-In composite layers formed due to the interdiffusion were derived from ellipsometric quantities Ψ and Î measured in the photon energy range 0.75-6.50 eV at different angles of incidence. The effective optical spectra show absorption peaks dependent on the composition of nonuniform films. The XRD patterns indicated formation of Pd1âxInx intermetallic phases in the samples.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
A.A. Wronkowska, A. Wronkowski, A. Bukaluk, M. TrzciÅski, K. Okulewicz,