Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5368349 | Applied Surface Science | 2007 | 4 Pages |
Abstract
We report spectroscopic ellipsometry studies in the energy range of 0.5-5Â eV on samples of 1-10 bilayers of polymer and HgTe nanocrystals, which exhibit strong transitions at higher critical points in the dispersion relation. We show that the dispersion relation for nanocrystals can be modelled with the same concepts for critical points as used in semiconductor bulk optics. We find an energy shift of up to 0.4Â eV of the critical points to higher energies compared to the HgTe bulk properties, caused by quantum confinement in the nanocrystals, which increases with decreasing nanocrystal size.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Veronika Rinnerbauer, Kurt Hingerl, Maksym Kovalenko, Wolfgang Heiss,