| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5368532 | Applied Surface Science | 2006 | 6 Pages |
Abstract
Several novel methods for evaluation and interpretation of X-ray data from modern nanostructures are presented along with their applications. The background of methods and their relations to fundamental problems of X-ray analysis is shortly described. The key features of LEPTOS software, which is designed for the analysis of X-ray data measured with various geometries and setups and implements all discussed techniques, are discussed.
Related Topics
Physical Sciences and Engineering
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Physical and Theoretical Chemistry
Authors
A. Ulyanenkov,