| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5368533 | Applied Surface Science | 2006 | 6 Pages |
Abstract
Beside the results on the Sb-based heterostructures, the use of X-ray scattering metrology as a routinely working non-destructive testing method has been emphasized.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
C. Renard, O. Durand, X. Marcadet, J. Massies, O. Parillaud,