| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5368580 | Applied Surface Science | 2006 | 5 Pages |
Abstract
Metal-organic chemical vapor deposition (MOCVD) made layers of strontium-bismuth-tantalate (SBT) were characterized by spectroscopic ellipsometry (SE) using the Adachi model [S. Adachi, Phys. Rev. B 35 (1987) 7454-7463]. The evaluated optical parameters were correlated with the physical and chemical behavior examined by X-ray diffraction (XRD).As a result, it was possible to fit the measured spectra with the Adachi model in a wide range covering the region of the band gap. The Adachi model provides electronic layer parameters like the transition energy E0 and broadening Î. Our investigations established a correlation between XRD-determined average grain size and the electronic layer parameters.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
M. Fried, P. Petrik, Z.E. Horváth, T. Lohner, C. Schmidt, C. Schneider, H. Ryssel,