| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5368591 | Applied Surface Science | 2006 | 5 Pages |
Abstract
We report spectroscopic characterization of epitaxial YBCO thin films grown on LaAlO3 by pulsed laser deposition. Raman spectroscopy and spectroscopic ellipsometry were used for film characterization and the results were correlated with X-ray diffraction measurements. The mentioned techniques allowed us to analyze crystallographic, micro-structural, and morphological properties of YBCO thin films. We also demonstrated that relatively low resolution Raman spectroscopy and spectroscopic ellipsometry are reliable techniques for a rapid and non-destructive characterization of epitaxial YBCO thin films.
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Authors
M. Branescu, A. Vailionis, M. Gartner, M. Anastasescu,