Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5368734 | Applied Surface Science | 2010 | 6 Pages |
Abstract
In this work, we have studied the surface morphology of photo-irradiated poly(p-phenylene vinylene) (PPV) thin films by using atomic force microscopy (AFM). We have analyzed the first-order statistical parameters, the height distribution and the distance between selected peaks. The second-order statistical analysis was introduced calculating the auto-covariance function to determine the correlation length between heights. We have observed that the photo-irradiation process produces a surface topology more homogeneous and isotropic such as a normal surface. In addition, the polymer surface irradiation can be used as a new methodology to obtain materials optically modified.
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Authors
Alexandre Marletta, M.L. Vega, C.A. Rodrigues, Y. Galvão Gobato, L.F. Costa, R.M. Faria,