Article ID Journal Published Year Pages File Type
5368825 Applied Surface Science 2006 4 Pages PDF
Abstract

The C60 erosion behaviour of poly(methyl)methacrylate (PMMA), poly(α-methyl)styrene (PAMS) and polystyrene (PS) has been studied at various temperatures and compared with that under Ga+ irradiation. Strong variations of erosion yields are observed, indicating that chemical degradation mechanisms are operating. In particular, our results suggest that fast depolymerization mechanisms are important in leaving the surface of the sputter crater virtually undamaged. Since such mechanisms are connected with the chemical nature of the polymer, the possibility of performing molecular depth profiling of polymers with C60 appears to depend strongly on the chemical nature of the system under study.

Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Authors
, , , , ,