| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5368846 | Applied Surface Science | 2006 | 4 Pages |
Abstract
The occurrence and formation of black spots areas in PolyLED devices has been studied by time-of-flight SIMS (TOFSIMS). The composition, shape and position of the black spots is visualised by three-dimensional (3D)-TOFSIMS depth-profiling. It has been established that the formation of non-emissive spots is due to the growth of aluminium oxide clusters at the AlBa/polymer interface. Electron injection in the black spots is lost by the resulting local increase of the resistivity of the cathode.
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Authors
C.W.T. Bulle-Lieuwma, P. van de Weijer,