| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5368883 | Applied Surface Science | 2006 | 4 Pages |
Abstract
TOF-SIMS is undoubtedly a highly useful technique for identifying hybridized DNA on PNA biosensor chips. It is suitable for studying the complexity of the immobilization and hybridization processes and may provide a rapid method for DNA diagnostics. With the absence of the labeling procedure and the simultaneous increase of the phosphate signal as a result of increasing DNA sequence length, this technique comes to be especially useful for the direct analysis of genomic DNA.
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Authors
S. Hellweg, A. Jacob, J.D. Hoheisel, T. Grehl, H.F. Arlinghaus,