Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5368969 | Applied Surface Science | 2009 | 5 Pages |
Abstract
Formation processes of titanium silicide on hydrogen-terminated H/Si(0Â 0Â 1)-2Â ÃÂ 1 surface are studied at the atomic scale with a scanning tunneling microscopy (STM). Square-shaped nanoislands were observed on the Ti/H/Si(0Â 0Â 1) surface after annealed at 873-1073Â K. These are the epitaxial nanoislands moderately grown due to the local orientation relationship between C49-TiSi2 and Si(0Â 0Â 1), because passivation by surface hydrogen on Si(0Â 0Â 1) suppresses active and complex bond formation of Ti-Si.
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Authors
T. Aoki, K. Shudo, K. Sato, S. Ohno, H. Nishioka, T. Iida, M. Toramaru, M. Tanaka,