Article ID Journal Published Year Pages File Type
5369219 Applied Surface Science 2006 4 Pages PDF
Abstract
Nanostructures based on iron oxides in the form of thin films were synthesized while laser chemical vapor deposition (LCVD) of elements from iron carbonyl vapors (Fe(CO)5) under the action of Ar+ laser radiation (λL = 488 nm) on the Si substrate surface with power density about 102 W/cm2 and vapor pressure 666 Pa. Analysis of surface morphology and relief of the deposited films was carried out with scanning electron microscopy (SEM) and atomic force microscopy (AFM). This analysis demonstrated their cluster structure with average size no more than 100 nm. It was found out that the thicker the deposited film, the larger sizes of clusters with more oxides of higher oxidized phases were formed. The film thickness (d) was 10 and 28 nm. The deposited films exhibited semiconductor properties in the range 170-340 K which were stipulated by oxide content with different oxidized phases. The width of the band gap Eg depends on oxide content in the deposited film and was varied in the range 0.30-0.64 eV at an electrical field of 1.6 × 103 V/m. The band gap Eg was varied in the range 0.46-0.58 eV at an electrical field of 45 V/m. The band gap which is stipulated by impurities in iron oxides Ei was varied in the range 0.009-0.026 eV at an electrical field of 1.6 × 103 V/m and was varied in the range 0-0.16 eV at an electrical field 45 V/m. These narrow band gap semiconductor thin films displayed of the quantum dimensional effect.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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