Article ID Journal Published Year Pages File Type
5369369 Applied Surface Science 2008 6 Pages PDF
Abstract

Hydrogenated nanocrystalline silicon (nc-Si:H) grown by hot-wire chemical vapor deposition (HWCVD) has recently drawn significant attention in the area of thin-film large area optoelectronics due to possibility of high deposition rate. We report on the effects of diborane (B2H6) doping ratio on the microstructural and optoelectrical properties of the p-type nc-Si:H thin films grown by HWCVD at low substrate temperature of 200 °C and with high hydrogen dilution ratio of 98.8%. An attempt has been made to elucidate the boron doping mechanism of the p-type nc-Si:H thin films deposited by HWCVD and the correlation between the B2H6 doping ratio, crystalline volume fraction, optical band gap and dark conductivity.

Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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