Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5369484 | Applied Surface Science | 2008 | 6 Pages |
Abstract
The microstructural changes and phase decomposition at the surface of an ultra-precision machined Zn-Al based alloy were studied using optical microscopy, back-scattered electron microscopy, electron back-scattered diffraction and X-ray diffraction techniques. It was found that with increasing DoC the phase decomposition was accelerated and further increasing DoC might cause a microstructural recovery on the surface of the UPM specimen. UPM induced phase decomposition was discussed in relation to the structural evolution of the chips.
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Authors
S. To, Y.H. Zhu, W.B. Lee,