Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5369533 | Applied Surface Science | 2008 | 6 Pages |
Abstract
TiO2 thin films, employed in dye-sensitized solar cells, were prepared by the sol-gel method or directly by Degussa P25 oxide and their surfaces were characterized by X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The effect of adsorption of the cis-[Ru(dcbH2)2(NCS)2] dye, N3, on the surface of films was investigated. From XPS spectra taken before and after argon-ion sputtering procedure, the surface composition of inner and outer layers of sensitized films was obtained and a preferential etching of Ru peak in relation to the Ti and N ones was identified. The photoelectrochemical parameters were also evaluated and rationalized in terms of the morphological characteristics of the films.
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Authors
Antonio Otávio T. PatrocÃnio, Eucler B. Paniago, Roberto M. Paniago, Neyde Y. Murakami Iha,