Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5369824 | Applied Surface Science | 2007 | 7 Pages |
Abstract
Si nano-composites were precipitated on LiF crystals following ablation from Si targets with laser light at 157 nm. The LiF/Si interface was analyzed with scanning electron microscopy, atomic force microscopy and energy dispersive X-ray microanalysis. It was found that Si composites were strongly attached to LiF ionic sites to form inhomogeneous structures consisted of small isotropic crystals 0.1-1 μm long, rich in Si and fluorine, which eventually further agglomerate to form larger structures. The thickness of the LiF/Si interface was increased from 50 nm to 2 μm following laser irradiation at 157 nm, due to accelerated adsorption of Si in the LiF interface by VUV light.
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Authors
E. Sarantopoulou, Z. Kollia, A.C. Cefalas, S. Kobe,