Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5369851 | Applied Surface Science | 2007 | 5 Pages |
Abstract
Growth as well as crystallographic and electronic properties of thin AlOx layers on Fe(110) were studied by means of low-energy electron diffraction and Auger-electron spectroscopy. Al layers of different thickness were deposited on Fe(110) and successfully oxidized to AlOx. The step-by-step oxidation of thin Al layers at room temperature leads to the formation of amorphous AlOx on top of the Fe(110) surface. A subsequent annealing at 250â°C of the oxidized 7-à thick Al layer results in the formation of a well-ordered Al2O3(0001) layer on the Fe(110) surface.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Yu.S. Dedkov, M. Fonin,