| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5369868 | Applied Surface Science | 2007 | 5 Pages |
Abstract
In this study, the effects of an (NH4)2Sx treatment on the surface work function (SWF) and roughness of indium-tin-oxide (ITO) have been investigated. From the observed X-ray photoelectron spectroscopy results, optical transmittance measurements, atomic force microscopy measurements and four-point probe measurements, it is suggested that the surface chemical changes and an increase in the sheet resistance had strong effects on the SWF of ITO. We find that the S occupation of oxygen vacancies near the ITO surface after (NH4)2Sx treatment may result in a marked increase in the SWF and a slight increase in the surface roughness.
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Authors
Yow-Jon Lin, Chang-Feng You, Chia-Lung Tsai,