RETRACTED: Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique

This article has been retracted: please see Elsevier Policy on Article Withdrawal (http://www.elsevier.com/locate/withdrawalpolicy).This article has been retracted at the request of the Editor-in-Chief.This article has been retracted as Figures 2, 3, 6b, 7a, 7b, 8a and 8b duplicate figures from the article that was published by the authors in Applied Optics 45 (2006) 3243-3252, https://doi.org/10.1364/AO.45.003243.Also the article duplicates parts of the text of the articles that were published by the authors in Applied Optics 45 (2006) 3243-3252, https://doi.org/10.1364/AO.45.003243 and Applied Surface Science 253 (2006) 618-626, http://dx.doi.org/10.1016/j.apsusc.2005.12.148.One of the conditions of submission of a paper for publication is that authors declare explicitly that their work is original and has not appeared in a publication elsewhere. Re-use of any data should be appropriately cited. As such this article represents an abuse of the scientific publishing system. The scientific community takes a very strong view on this matter and apologies are offered to readers of the journal that this was not detected during the submission process.