Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5370120 | Applied Surface Science | 2006 | 5 Pages |
Abstract
Scanning Auger microscopy and micro-Raman spectroscopy are combined to characterize a Co-Se thin film sample, containing 84Â at.% Se, which had been modified in localized areas following excitation with an intense focused Ar+ laser (514.5Â nm). The information obtained helps to establish that a previous assignment for a Co-Se sample of Raman features between 168 and 175Â cmâ1 actually refers to an oxygenated Co-Se species, and that Co-Se interactions in a Se-rich environment give rise to Raman structure between 181 and 184Â cmâ1. Comparisons are made for the use of Ar+ and HeNe laser sources for Raman measurements in this context; the latter in general gives both better resolution and better signal-to-noise characteristics.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
M. Teo, P.C. Wong, L. Zhu, D. Susac, S.A. Campbell, K.A.R. Mitchell, R.R. Parsons, D. Bizzotto,