| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5370296 | Applied Surface Science | 2006 | 6 Pages |
Abstract
Single crystals of ammonium dihydrogen phosphate (ADP) mixed with different mole concentrations of thiourea were grown using slow evaporation solution technique at 30 °C. In order to study the effect of mixing thiourea on the structural characteristics of ADP, X-ray diffraction studies were carried out on the crystals using Shimadzu X-ray diffractometer with Cu Kα radiation. X-ray study revealed that the structures of the thiourea-mixed ADP are slightly distorted compared to the pure ADP crystal structure. Inclusion of thiourea enhances the growth of (1¯00) plane of the ADP crystal. Thiourea-mixed ADP crystals were found to have maximum inclusion, as the thiourea concentration was 10 mol%.
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Chemistry
Physical and Theoretical Chemistry
Authors
A. Jayarama, S.M. Dharmaprakash,