| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5370326 | Applied Surface Science | 2006 | 4 Pages |
Abstract
Poly(zinc 1,6-hexanedithiolate) thin film, a precursor to prepare ZnS thin film, was self-assembled on a quartz substrate. The UV-vis spectra monitored the annealing process of the poly(zinc 1,6-hexanedithiolate) film, which revealed that the ZnS thin film began to form at approximately 515Â K. The result of XRD confirmed the crystallinity of ZnS. With increase of annealing temperature, a red shift of the emission spectra was observed.
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Authors
Jin Mu, Yunyan Zhang,