Article ID Journal Published Year Pages File Type
5370453 Applied Surface Science 2006 5 Pages PDF
Abstract

Experimental determination of phosphorus cross-contamination during antimony implantation is presented. As a suitable structure for this experiment, a buried layer was employed which is created by implanting antimony followed by a long diffusion process. The samples implanted in different implanters were analysed by secondary ion mass spectrometry (SIMS), four-point probe and spreading resistance methods. The obtained results were compared with those calculated by program SUPREM-IV. Methods that can and cannot be used to determine phosphorus contamination during antimony implantation and to estimate the fluence of phosphorus being co-implanted with antimony are described in detail.

Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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