| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5374555 | Chemical Physics | 2012 | 9 Pages |
Abstract
⺠We compare ultrafast X-rays and electron pulses for imaging diffraction and spectroscopy. ⺠Modern electron technology is a valid complement to more expensive X-ray tools. ⺠We propose a novel approach that combines X-rays pump and electron probing for material science.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
F. Carbone, P. Musumeci, O.J. Luiten, C. Hebert,