| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5379145 | Chemical Physics Letters | 2016 | 22 Pages |
Abstract
- Electron density profile (EDP) across solar cells is estimated by X-ray reflectivity.
- A correlation is established between EDP and S-kink characteristics.
- EDP is enhanced at interface of hole transport/active layer in annealed devices.
- The correlation is supported by Kelvin probe and XPS measurements.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Abhay Gusain, Surendra Singh, A.K. Chauhan, Vibha Saxena, P. Jha, P. Veerender, Ajay Singh, P.V. Varde, Saibal Basu, D.K. Aswal, S.K. Gupta,