| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5381568 | Chemical Physics Letters | 2013 | 6 Pages |
Abstract
- Polymer-fullerene nanostructured films using poly(3-hexylthiophene) fibers were studied.
- Morphological reliability was monitored in situ, at the devices typical working temperatures.
- Characterization was performed by joint X-ray and AFM time-resolved techniques.
- The as-deposited films were found to be characterized by superior structural stability.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
B. Paci, A. Generosi, V. Rossi Albertini, R. de Bettignes,