| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5382846 | Chemical Physics Letters | 2012 | 5 Pages |
Abstract
⺠Structural characterization of picene thin films under vacuum and O2 atmosphere by X-ray scattering. ⺠Determination of unit cell structure, film thickness and roughness. ⺠Formation of highly oriented and ordered crystalline domains. ⺠A very small and irreversible change in film morphology by O2 atmosphere. ⺠Implication of O2 gas sensing mechanism of picene thin film-based organic field-effect transistors.
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Authors
T. Hosokai, A. Hinderhofer, A. Vorobiev, C. Lorch, T. Watanabe, T. Koganezawa, A. Gerlach, N. Yoshimoto, Y. Kubozono, F. Schreiber,