| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5383354 | Chemical Physics Letters | 2012 | 5 Pages |
Abstract
⺠The ET reaction from DMA to PINO is studied within a conceptual DFT framework. ⺠Hardness ÏAD is related to the DMA/PINO intrinsic electronic reorganization energy, λe.⺠The vertical electronic energy, ÎEvert, is linearly correlated to ÏAD namely ÎEvert = 0.872ÏAD + 4.284; R2 = 0.994, in CH3CN. ⺠Experimental rate constants are linearly correlated to ÏAD, i.e., ln kAD = â0.779ÏAD + 38.364; R2 = 0.980 in CH3CN. ⺠Substituent effects are rationalized in agreement with experiments.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Eduardo Chamorro, Jorge Bessolo, Mario Duque-Noreña, Patricia Pérez,
