| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5383940 | Chemical Physics Letters | 2011 | 6 Pages |
Abstract
⺠We developed a new method for metal refining where silicon was treated with copper as refining element. ⺠The highest concentration of trace elements was at the phase boundaries between Si and Cu-Si intermetallic. ⺠After treatment with Cu, 21 elements were not detected in pure Si. ⺠The amount of the trace elements decreased from 2 to 100 times in the refined Si compared to the initial metallurgical Si.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Aleksandar M. MitraÅ¡inoviÄ, Torstein A. Utigard,