| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5384229 | Chemical Physics Letters | 2011 | 5 Pages |
Abstract
âºA new method for depth profiling the core-energy levels of solid surfaces is presented. ⺠The angle-variation of the X-ray photoemission spectra is precisely derived. ⺠The data are transformed to core-energy levels vs. the depth from the surface. ⺠Energy levels of buried organic/metal interface were determined. ⺠The difference in C1s core level energies between the surface and bulk is 0.3 eV.
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Physical Sciences and Engineering
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Authors
Hiroyuki Yoshida, Naoki Sato,