| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5385193 | Chemical Physics Letters | 2010 | 5 Pages |
Abstract
⺠The electronic structures of C60/SiO2 and C60/SiON and energy diagrams are described. ⺠The surface nitrogen reduces the work function of the SiON compared to the SiO2. ⺠The LUMO offset is determined by the work function of each dielectric substrate. ⺠The threshold voltage is related to the work function of the dielectric layer used.
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Authors
S.W. Cho, Y. Yi, K.B. Chung, S.J. Kang, M.-H. Cho,