| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5385739 | Chemical Physics Letters | 2009 | 5 Pages |
Abstract
The innovative potential of a non-commercial apparatus for simultaneous in situ Atomic Force Microscopy (AFM) and Energy Dispersive X-ray Reflectometry (EDXR) measurements is presented.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
B. Paci, A. Generosi, R. Generosi, D. Bailo, V. Rossi Albertini,