Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5385798 | Chemical Physics Letters | 2009 | 4 Pages |
Abstract
Using the full potential linearized augmented plane wave method, we calculate the magnetism and electronic structure for Ti-doped AlN. Calculations indicate the Ti can induce AlN a n-type ferromagnetic semiconductor. The shallower donor levels indicate the Ti-doped AlN can be easily ionized easily at working temperature. For the O and Ti co-doped AlN, calculations show ON defect may induce the magnetic moments increasing and also change Ti-doped AlN from semiconductor to metal. Compared to the conventional TMs-doped DMSs, Ti-doped AlN is free of ferromagnetic precipitate problems because compounds (TiN, AlN and TiAl) are not ferromagnetic.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
S.W. Fan, K.L. Yao, Z.G. Huang, J. Zhang, G.Y. Gao, G.H. Du,