Article ID Journal Published Year Pages File Type
5385798 Chemical Physics Letters 2009 4 Pages PDF
Abstract
Using the full potential linearized augmented plane wave method, we calculate the magnetism and electronic structure for Ti-doped AlN. Calculations indicate the Ti can induce AlN a n-type ferromagnetic semiconductor. The shallower donor levels indicate the Ti-doped AlN can be easily ionized easily at working temperature. For the O and Ti co-doped AlN, calculations show ON defect may induce the magnetic moments increasing and also change Ti-doped AlN from semiconductor to metal. Compared to the conventional TMs-doped DMSs, Ti-doped AlN is free of ferromagnetic precipitate problems because compounds (TiN, AlN and TiAl) are not ferromagnetic.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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