| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5388605 | Chemical Physics Letters | 2007 | 5 Pages |
Abstract
In situ scanning electron microscopy was used for elucidation of individual single-walled carbon nanotube extension process on a SiO2 substrate.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Iwao Wako, Tomohito Chokan, Daisuke Takagi, Shohei Chiashi, Yoshikazu Homma,