| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5388681 | Chemical Physics Letters | 2009 | 4 Pages |
Abstract
Metal/molecule/semiconductor devices fabricated using different metallization techniques exhibit significantly different electrical properties, which can be correlated to various degrees of metal penetration and monolayer disorder, as observed using time-of-flight secondary ion mass spectrometry and Fourier transform infrared spectroscopy.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Patrick D. Carpenter, Saurabh Lodha, David B. Janes, Amy V. Walker,