| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5389673 | Chemical Physics Letters | 2006 | 7 Pages |
Abstract
X-ray photoelectron spectroscopy (XPS) is shown to be a sensitive tool to study the influence of water on the dispersion of silica SBA-15 supported vanadia model catalysts XPS characterization of the V 2p3/2 state reveals the presence of two V5+ states, which are assigned to vanadia with distinctly different cluster size. Upon dehydration a dramatic change in their intensity ratio is observed as a result of a substantial increase in the vanadia dispersion.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Christian Hess, Robert Schlögl,