| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 5389750 | Chemical Physics Letters | 2006 | 6 Pages | 
Abstract
												Extremely smooth, thin, and continuous ultrananocrystalline diamond films were synthesized by microwave plasma chemical vapor deposition using a 10 nm tungsten (W) interlayer between the silicon substrate and the diamond film. The W interlayer significantly increased the initial diamond nucleation density, thereby lowering the surface roughness and eliminating interfacial voids.
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											Authors
												Nevin N. Naguib, Jeffrey W. Elam, James Birrell, Jian Wang, David S. Grierson, Bernd Kabius, Jon M. Hiller, Anirudha V. Sumant, Robert W. Carpick, Orlando Auciello, John A. Carlisle, 
											