| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5390135 | Chemical Physics Letters | 2006 | 4 Pages |
Abstract
The conductance behavior of the stretching processes in the STM break junction experiments was theoretically studied. The expected value of conductance computed with the three kinds of processes shows a flat plateau of conductance similar to the one observed by Xiao et al. [Nano Lett. 4 (2003) 267].
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Satoru Tanibayashi, Tomofumi Tada, Satoshi Watanabe, Hideo Sekino,